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Analog MEMS Accelerometer Series (±10–±50 g)

MEMS Accelerometer (Analog Output) · JDWDG070

Analog-output MEMS accelerometer family with selectable measurement ranges from ±10 g to ±50 g, 200 Hz bandwidth, and zero bias stability down to ≤0.5 mg. 0.5–4.5 V analog output in a compact LCC28 package, 10,000 g overload rating, and ≤10 mA operating current over −40 °C to +85 °C.

Performance SpecificationsMeasurement Range
±20±10
Performance SpecificationsMeasurement Range
±30±10
Performance SpecificationsBandwidth
200
Read full specifications and measurement conditions ↓
Analog MEMS Accelerometer Series (±10–±50 g)
JDWDG070Product reference

Confirm configuration, interfaces and documentation with your inquiry.

The JDWDG068 is a high-performance analog MEMS accelerometer engineered for precision sensing applications requiring exceptional stability and reliability. It supports four selectable measurement ranges (±10g, ±20g, ±30g, ±50g) and features excellent zero bias stability down to ≤0.5 mg. With high repeatability, low noise, and robust temperature performance, this accelerometer is well-suited for use in aerospace, industrial control, and structural monitoring systems. The device’s analog output and compact LCC28 package ensure ease of integration into a wide range of analog signal acquisition environments.

Key Features

  • Multiple measurement ranges from ±10g to ±50g
  • High bandwidth of 200Hz across all ranges
  • Excellent zero bias stability and repeatability
  • Low temperature coefficient for stable operation
  • Analog output with 0.5V-4.5V range
  • Compact LCC28 packaging
  • High overload rating of ≥10000g
  • Wide operating temperature range (-40°C to 85°C)
  • Low power consumption with ≤10mA operating current

Applications

Industrial vibration monitoringStructural health monitoringSeismic monitoringTransportation and vehicle dynamicsPlatform stabilizationMotion and shock detectionInertial measurement systemsTest and measurement equipment

Technical Specifications

Performance Specifications

Measurement Range
±20±10
Bandwidth
200
Zero Bias Stability (1σ)
≤1≤0.5
Zero Bias Repeatability (1σ)
≤2≤0.5
Zero Bias Temperature Coefficient
≤2≤1
Scale Factor Repeatability
≤300
Scale Factor Nonlinearity
≤3000
Output Type
Analog(0.5V-4.5V)
Packaging Type
LCC28
Measurement Axis
Z - Axis
Package Dimensions
14×8.9×3.2
Overload Rating
≥10000
Operating Temperature Range
-40~85
Supply Voltage
5±0.1
Operating Current
≤10

Performance Specifications

Measurement Range
±30±10
Bandwidth
200
Zero Bias Stability (1σ)
≤1
Zero Bias Repeatability (1σ)
≤1≤0.5
Zero Bias Temperature Coefficient
≤1
Scale Factor Repeatability
≤300
Scale Factor Nonlinearity
≤3000≤2000
Output Type
Analog(0.5V-4.5V)
Packaging Type
LCC28
Measurement Axis
X - Axis
Package Dimensions
14×8.9×3.2
Overload Rating
≥10000
Operating Temperature Range
-40~85
Supply Voltage
5±0.1
Operating Current
≤10
  1. [1]This series covers multiple variants; where two figures are shown for one parameter they correspond to different variants — confirm the exact variant at inquiry.
  2. [2]Zero bias stability and zero bias repeatability figures are 1σ values.

Frequently Asked Questions

What is JDWDG070?+

Analog-output MEMS accelerometer family with selectable measurement ranges from ±10 g to ±50 g, 200 Hz bandwidth, and zero bias stability down to ≤0.5 mg. 0.5–4.5 V analog output in a compact LCC28 package, 10,000 g overload rating, and ≤10 mA operating current over −40 °C to +85 °C.

Which specifications are published for JDWDG070?+

Performance Specifications — Bandwidth: 200; Performance Specifications — Scale Factor Repeatability: ≤300; Performance Specifications — Scale Factor Nonlinearity: ≤3000. Measurement conditions: This series covers multiple variants; where two figures are shown for one parameter they correspond to different variants — confirm the exact variant at inquiry. Zero bias stability and zero bias repeatability figures are 1σ values. See the technical specifications for the complete parameter list.

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  • Datasheet (PDF)

    Full performance curves, pinout diagrams, and environmental testing results.

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